Authors: |
Kurt H. Riitters, R.V. O'Neill, C.T. Hunsaker, James D. Wickham, D.H. Yankee, S.P. Timmins, K.B. Jones, B.L. Jackson |
Year: |
1995 |
Type: |
Scientific Journal |
Station: |
Southern Research Station |
Source: |
Landscape Ecology vol. 10 no. 1 pp 23-39 (1995) |
Abstract
Fifty-five metrics of landscape pattern and structure were calculated for 85 maps of land use and land cover. A multivariate factor analysis was used to identify the common axes (or dimensions) of pattern and structure which were measured by a reduced set of 26 metrics. The first six factors explained about 87% of the variation in the 26 landscape metrics. These factors were interpreted as composite measures of average patch compaction, overall image texture, average patch shape, patch perimeter-area scaling, number of attribute classes, and large-patch density-area scaling. We suggest that these factors can be represented in a simpler way by six univariate metrics -- average perimeter-area ratio, contagion, standardized patch shape, patch perimeter-area scaling, number of attribute classes, and large-patch density-area scaling.
Citation
Riitters, Kurt H.; O''Neill, R.V.; Hunsaker, C.T.; Wickham, James D.; Yankee, D.H.; Timmins, S.P.; Jones, K.B.; Jackson, B.L. 1995. A factor analysis of landscape pattern and structure metrics. Landscape Ecology vol. 10 no. 1 pp 23-39 (1995)